24-25 April 2017, Prague, Czech Republic in SearchWorks catalog (2024)

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Responsibility
Libor Juha, Saša Bajt, Regina Soufli ; sponsored by SPIE ; cooperating organisations, Science and Technology Facilities Council (United Kingdom) [and 6 others]
Digital
text file
video file
Publication
Bellingham, Washington : SPIE, [2017]
Copyright notice
©2017
Physical description
1 online resource : illustrations (some color), sound, color
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 10236.

Description

Creators/Contributors

Meeting
Damage to VUV, EUV, and X-Ray Optics (Conference) (6th : 2017 : Prague, Czech Republic)
Contributor
Juha, Libor, editor.
Bajt, Saša, editor.
Soufli, Regina, editor.
SPIE (Society), sponsoring body, publisher.
Science and Technology Facilities Council (Great Britain)
SPIE Optics + Optoelectronics (Conference) (2017 : Prague, Czech Republic)

Contents/Summary

Bibliography
Includes bibliographical references and author index
Contents
  • A finite element approach to x-ray optics design / A. P. Honkanen, C. Ferrero, J. P. Guigay, V. Mocella
  • Ultrafast breakdown of dielectrics: new insight from double pump-probe experiments (Conference Presentation) / Stéphane Guizard, Alexandros Mouskeftaras, Allan Bildé, Sergey M. Klimentov, Nikita Fedorov
  • Investigating radiation induced damage processes with femtosecond x-ray pulses (Conference Presentation) / Changyong Song
  • Is there any dose-rate effect in breaking DNA strands by short pulses of extreme ultraviolet and soft x-ray radiation? (Conference Presentation) / Ludek Vyín, Tomá Burian, Egor Ukraintsev, Marie Davídková, Libor Juha, Michael E. Grisham, Scott C. Heinbuch, Jorge J. Rocca
  • Growth of nano-dots on the grazing incidence mirror surface under FEL irradiation: analytic approach to modeling / I. V. Kozhevnikov, A. V. Buzmakov, F. Siewert, K. Tiedtke, M. Störmer, L. Samoylova, H. Sinn
  • Low-pressure RF remote plasma cleaning of carbon-contaminated B4C-coated optics / H. Moreno Fernández, M. Thomasset, G. Sauthier, D. Rogler, R. Dietsch, R. Barrett, V. Carlino, E. Pellegrin
  • Study of performance loss of Lyman alpha filters due to chemical contamination / Delphine Faye, Xueyan Zhang, Pierre Etcheto, Frédéric Auchère
  • Non-thermal damage to lead tungstate induced by intense short-wavelength laser radiation (Conference Presentation) / Vojtech Vozda, Pavel Bohácek, Tomá Burian, Jaromir Chalupský, Vera Hájková, Libor Juha, Ludek Vyín, Jérôme Gaudin, Philip A. Heimann, Stefan P. Hau-Riege, Marek Jurek, Dorota Klinger, Jacek Krzywinski, Marc Messerschmidt, Stefan P. Moeller, Robert Nagler, Jerzy B. Pelka, Michael Rowen, William F. Schlotter, Michele L. Swiggers, Harald Sinn, Ryszard Sobierajski, Kai Tiedtke, Sven Toleikis, Thomas Tschentscher, Joshua J. Turner, Hubertus Wabnitz, Art J. Nelson, Maria V. Kozlova, Sam M. Vinko, Thomas Whitcher, Thomas Dzelzainis, Oldrich Renner, Karel Saksl, Roland R. Fäustlin, Ali R. Khorsand, Marta Fajardo, Bianca S. Iwan, Jakob Andreasson, Janos Hajdu, Nicusor Timneanu, Justin S. Wark, David Riley, Richard W. Lee, Mitsuru Nagasono, Makina Yabashi
  • Classical Monte-Carlo simulations of x-ray induced electron cascades in various materials / Vladimir Lipp, Nikita Medvedev, Beata Ziaja
  • Influence of model parameters on a simulation of x-ray irradiated materials: example of XTANT code / Nikita Medvedev, Vladimir Lipp
  • Formation of periodic relief at Sc/Si multilayer surface under EUV laser irradiation / Y. P. Pershyn, A. Zolotaryov, J. J. Rocca, A. Y. Devizenko, V. V. Kondratenko, I. A. Artyukov, A. V. Vinogradov
  • Optical and structural characterization of Nb, Zr, Nb/Zr, Zr/Nb thin films on Si3N4 membranes windows / K. Jimenez, A. E. H. Gaballah, Nadeem Ahmed, P. Zuppella, P. Nicolosi

Subjects

Subjects
Optical materials > Deterioration > Congresses.
X-ray optics > Congresses.
X-ray optics.
Genre
Conference papers and proceedings.
Nonfiction films.
Speeches

Bibliographic information

Publication date
2017
Copyright date
2017
Title variation
Damage to VUV, EUV, and X-Ray Optics 6
Damage to VUV, EUV, and X-Ray Optics six
Series
Proceedings of SPIE, 0277-786X ; volume 10236
Note
Includes video transcripts
"SPIE Optics + Optoelectronics, 24-27 April 2017, Prague, Czech Republic"--HTML home page
Note
Video presentations in English with optional English subtitles
ISBN
9781510609747 (electronic)
1510609741 (electronic)
9781510609730

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24-25 April 2017, Prague, Czech Republic in SearchWorks catalog (2024)
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